Festplattetndiagnosetool für Linux?

Habe mittlerweile "smartmontools" installiert, einen ersten check laufen lassen - aber mir sagt das ehrlich gesagt herzlich wenig. Wärt ihr so nett, mir das mal allgemeinverständlich zu interpretieren - Hintergrund ist, dass meine Notebook HD lt. "hd tune" (läuft unter Windows XP auf einer Dualboot)einen fehlerhaften Sektor aufweist.. Hier der Ausdruck:


lineadiretta:~ # smartctl -a /dev/hda
smartctl version 5.33 [i686-pc-linux-gnu] Copyright (C) 2002-4 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model: IC25N060ATMR04-0
Serial Number: MRG3X9KCHPXGUH
Firmware Version: MO3OAD4A
User Capacity: 60,011,642,880 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 3a
Local Time is: Fri Jan 12 15:21:34 2007 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off supp
ort.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 53) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_
FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always -
0
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline -
0
3 Spin_Up_Time 0x0007 131 131 033 Pre-fail Always -
1
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always -
201
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always -
0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always -
0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline -
0
9 Power_On_Hours 0x0012 100 100 000 Old_age Always -
148
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always -
0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always -
186
191 G-Sense_Error_Rate 0x000a 099 099 000 Old_age Always -
131073
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always -
12
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always -
1978
194 Temperature_Celsius 0x0002 157 157 000 Old_age Always -
35 (Lifetime Min/Max 17/47)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always -
0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always -
1
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline -
0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always -
0

SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 2 occurred at disk power-on lifetime: 144 hours (6 days + 0 hours)
When the command that caused the error occurred, the device was active or idle
.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 3c c4 35 4c e1 Error: UNC 60 sectors at LBA = 0x014c35c4 = 21771716

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 d1 40 c0 35 4c e1 00 03:37:21.900 READ DMA
c8 d1 40 80 35 4c e1 00 03:37:21.900 READ DMA
c8 d1 40 40 35 4c e1 00 03:37:21.900 READ DMA
c8 d1 40 00 35 4c e1 00 03:37:21.900 READ DMA
c8 d1 40 c0 34 4c e1 00 03:37:21.800 READ DMA

Error 1 occurred at disk power-on lifetime: 142 hours (5 days + 22 hours)
When the command that caused the error occurred, the device was active or idle
.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 3c c4 35 4c e1 Error: UNC 60 sectors at LBA = 0x014c35c4 = 21771716

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 d1 40 c0 35 4c e1 00 00:55:37.300 READ DMA
c8 d1 40 80 35 4c e1 00 00:55:37.300 READ DMA
c8 d1 40 40 35 4c e1 00 00:55:37.300 READ DMA
c8 d1 40 00 35 4c e1 00 00:55:37.300 READ DMA
c8 d1 40 c0 34 4c e1 00 00:55:37.300 READ DMA

SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]


Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

lineadiretta:~ #



Vielen Dank schon mal..........